| 1. |
. |
AFNOR NF EN 61523-2 |
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2003-MAY-01 • 现用 •
Delay and power calculation standards - Part 2 : pre-layout delay calculation specification for CMOS ASIC libraries
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| 2. |
. |
AFNOR UTE C96-025 |
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1993-APR-01 • 现用 •
Microcircuits. Generic qualification for ASICs and ICs. Manufacturer approval and tqm concept (EQML).
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| 3. |
. |
BSI BS EN 61523-2 |
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2002-SEP-27 • 现用 •
Delay and power calculation standards Part 2: Pre-layout delay calculation specification for CMOS ASIC libraries
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| 4. |
. |
BSI BS IEC 61691-5 |
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2004-NOV-10 • 现用 •
Behavioural languages - Part 5: VITAL ASIC (application specific integrated circuit) modeling specification
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| 5. |
. |
CECC CECC 00 809 ISSUE 1 |
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1994-JAN-01 • 现用 •
Guidance Document: Questionnaire for Auditing IC & ASIC Manufacturing Lines (Based on EN 190 000) (En)
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| 6. |
. |
CENELEC EN 61523-2 |
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2002-AUG-01 • 现用 •
Delay and power calculation standards Part 2: Pre-layout delay calculation specification for CMOS ASIC libraries-IEC 61523-2: 2002
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| 7. |
. |
DIN DIN EN 61523-2 |
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2003-JUN-01 • 现用 •
Delay and power calculation standards - Part 2: Pre-layout delay calculation specification for CMOS ASIC libraries (IEC 61523-2:2002); German version EN 61523-2:2002, text in English
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| 8. |
. |
DIN DIN EN 61523-2 |
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2003-JUN-01 • 现用 •
Delay and power calculation standards - Part 2: Pre-layout delay calculation specification for CMOS ASIC libraries (IEC 61523-2:2002); German version EN 61523-2:2002, text in English
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| 9. |
. |
DS DS/EN 61523-2 |
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2002-SEP-23 • 现用 •
Delay and power calculation standards - Part 2: Pre-layout delay calculation specification for CMOS ASIC libraries
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| 10. |
. |
DS DS/IEC 512-1 |
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Date NA • 已撤销 •
Electromechanical components for electronic equipment; b asic testing procedures and measuring methods - Part 1: Gene ral
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