| 1. |
. |
IEEE 1671 |
|
|
2006-SEP-15 • 现用 •
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
|
|
| 2. |
. |
IEEE 1671.2 |
|
|
2008-SEP-26 • 现用 •
Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
|
|
| 3. |
. |
IEEE 1671.3 |
|
|
2007-DEC-05 • 现用 •
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Unit Under Test (UUT) Description Information
|
|
| 4. |
. |
IEEE 1671.4 |
|
|
2007-DEC-05 • 现用 •
Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
|
|
| 5. |
. |
IEEE 1671.5 |
|
|
2008-SEP-26 • 现用 •
Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Adapter Information
|
|
| 6. |
. |
IEEE 1671.6 |
|
|
2008-SEP-26 • 现用 •
Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
|
|
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