| 1. |
. |
IEEE 1450 |
|
|
1999-MAR-18 • 已撤销 •
Standard Interface Test Language (STIL) for Digital Test Vectors-IEEE Computer Society
|
|
| 2. |
. |
IEEE 1450.1 |
|
|
2005-JUN-09 • 现用 •
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450™1999) for Semiconductor Design Environments-IEEE Computer Society Document; Errata:12/20/2005
|
|
| 3. |
. |
IEEE 1450.2 |
|
|
2002-NOV-12 • 现用 •
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450 -1999) for DC Level Specification-IEEE Computer Society
|
|
| 4. |
. |
IEEE 1450.3 |
|
|
2007-MAR-08 • 现用 •
Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450™-1999) for Tester Target Specification-Computer Society
|
|
| 5. |
. |
IEEE 1450.6 |
|
|
2005-NOV-17 • 现用 •
IEEE Standard Test Interface Language (STIL) for Digital Test Vector DataCore Test Language (CTL)
|
|
| 6. |
. |
IEEE 1450.6.1 |
|
|
2009-MAY-13 • 现用 •
Describing On-Chip Scan Compression-IEEE Computer Society
|
|
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