| 1. |
. |
AFNOR FD ISO/TR 22335 |
|
|
2008-JUN-01 • 现用 •
Surface chemical analysis - Depth profiling - Measurement of sputtering rate : mesh-replica method using a mechanical stylus profilometer
|
|
| 2. |
. |
AFNOR NF ISO 14606 |
|
|
2008-APR-01 • 现用 •
Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
|
|
| 3. |
. |
AFNOR NF ISO 14707 |
|
|
2006-APR-01 • 现用 •
Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
|
|
| 4. |
. |
AFNOR NF ISO 15472 |
|
|
2006-AUG-01 • 现用 •
Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
|
|
| 5. |
. |
AFNOR NF ISO 17560 |
|
|
2006-APR-01 • 现用 •
Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
|
|
| 6. |
. |
AFNOR NF ISO 17973 |
|
|
2006-APR-01 • 现用 •
Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
|
|
| 7. |
. |
AFNOR NF ISO 17974 |
|
|
2009-MAY-01 • 现用 •
Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
|
|
| 8. |
. |
AFNOR NF ISO 18115 |
|
|
2006-APR-01 • 现用 •
Surface chemical analysis - Vocabulary-Modified by NF ISO 18115/A1:200807 (X21-052/A1),NF ISO 18115/A2:200808 (X21-052/A2)
|
|
| 9. |
. |
AFNOR NF ISO 18115/A1 |
|
|
2008-JUL-01 • 现用 •
Surface chemical analysis - Vocabulary - AMENDMENT 1
|
|
| 10. |
. |
AFNOR NF ISO 18115/A2 |
|
|
2008-AUG-01 • 现用 •
Surface chemical analysis - Vocabulary - Amendment 2
|
|
购物车